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Focused Ion Beam Scanning Electron Microscopy

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PISA – FEI - Helios G4 UC - Dual Beam (SEM-FIB)

FEI Helios G4 Dual Beam Helios G4 UC is part of the fourth generation of the leading Helios Dual Beam family. It combines the innovative Elstar electron column with high-current UC+ technology for extreme high-resolution imaging and the highest mate…
PISA – FEI Quanta 3D Dual Beam (SEM & FIB)

The FEI Quanta 3D FEG is a state-of-the-art Dual Beam machine combining traditional thermal emission scanning electron microscope (SEM) with focused ion beam (FIB). This combination allows the characterization of materials in 2D and 3D (tomography),…